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Atomic Force Microscope Probe Product List

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[Long lifespan, high durability type] Diamond probe for AFM/SPM

[Long lifespan, high durability type] Diamond probe for AFM/SPM

AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. ● Diamond Coated Probes - DCP Series: Probes with conductivity due to nitrogen-doped diamond coating. - HA_DCP Series: Probes with cantilevers at both ends of the chip and two different diamond-coated tips. ● Single Crystal Diamond Probes - DEP Series: Probes with conductivity, treated with boron-doped diamond coating on single crystal diamond. - DRP Series, DPRS Series: Probes designed for applications involving high mechanical loads and scratch tests. - FD Series: Probes that are insensitive to static electricity on the sample surface, making them easy to approach and suitable for topography imaging.

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  • Atomic Force Microscope Probe

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High-resolution type super sharp probe for AFM/SPM

High-resolution type super sharp probe for AFM/SPM

AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.

This is a probe for atomic force microscopy and scanning probe microscopy. We offer two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm. - Super Sharp DLC Probe: A probe equipped with a DLC tip at the tip's end that has a curvature radius of less than about 3 nm. Due to the DLC, it boasts high durability and long lifespan. - Super Sharp SS Probe: A probe with the tip's end sharpened to a curvature radius of about 2 nm.

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  • Analytical Equipment and Devices
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  • Atomic Force Microscope Probe

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Colloidal probe for AFM/SPM with spherical tip type

Colloidal probe for AFM/SPM with spherical tip type

This is a probe equipped with colloidal spheres instead of a standard tip. Colloidal spheres can be selected from multiple sizes.

This is a probe for atomic force microscopy and scanning probe microscopy. It is a contact mode probe with spherical particles fixed to a chipless cantilever, used for studying colloidal interactions between two surfaces and quantifying interaction characteristics. ● Applications - Direct measurement of surface forces - Colloidal interactions at the single particle - particle level - Direct measurement of cellular mechanics - Adhesion force measurement - Study of colloidal interactions between particles and surfaces

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  • Analytical Equipment and Devices
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  • Atomic Force Microscope Probe

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes
  • Atomic Force Microscope Probe

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